Confocal Microscope Studies of MoS2 Layer Thickness
نویسنده
چکیده
We have been studying micro-luminescence of various exfoliated MoS2 akes using a confocal microscope. A crucial issue is to determine thickness of the investigated layer. The common way using atomic force microscopy, electron microscopy or the Raman spectroscopy requires moving the sample out from the confocal microscope experimental setup and looking for a particular exfoliated ake hidden among thousands of others. In order to preliminarily determine thickness of investigated layers we have performed a study on optical re ectivity and compared the results with the Raman spectroscopy investigations. In this way we were able to calibrate our experimental setup. Optical measurements are much faster than the Raman spectroscopy and can give a good estimation of MoS2 thickness.
منابع مشابه
C4nr03703k 13028..13035 ++
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تاریخ انتشار 2014